J S Lee et al 2000 Semicond. Sci. Technol. 15 267 doi:10.1088/0268-1242/15/3/307
J S Lee
, Y H Bae
and Y H Lee§
A novel voltage-programmable link (VPL) with Al/BaTiO3 /SiO2 /TiW silicide /TiW structure has been developed for programmable device application. A programming cell to evaluate programming behaviour consists of an n-MOSFET and a VPL, which are connected in series. The programming process of the VPL was achieved through the switched n-MOSFET. The amorphous BaTiO3 film, prepared by means of an RF sputtering method, determines the program properties of the VPL owing to its lower breakdown field and metallic components. Sufficient low on resistance less than 10
and low programming voltage below 10 V can be realized by using BaTiO3 (120 Å)/SiO2 (150 Å) films as insulators while keeping sufficient off-state reliability.
85.30.De Semiconductor-device characterization, design, and modeling
Issue 3 (March 2000)
J S Lee et al 2000 Semicond. Sci. Technol. 15 267
P J Dunmore-Buyze et al 2002 Physiol. Meas. 23 555
F. Großmann and P. Hänggi 1992 Europhys. Lett. 18 1
M Houe and P D Townsend 1995 J. Phys. D: Appl. Phys. 28 1747
A Hooper and D W Lamb 2005 J. Phys.: Conf. Ser. 15 219
K W Allen et al 1956 Proc. Phys. Soc. A 69 705
N M Dowell-Mesfin et al 2004 J. Neural Eng. 1 78
G Carter 1996 J. Phys. D: Appl. Phys. 29 1619
D Mehtani et al 2006 J. Opt. A: Pure Appl. Opt. 8 S183
S F Dyubko and A N Topkov 1973 Sov. J. Quantum Electron. 3 56