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Structural and Optical Characteristics of InGaN/GaN Multi-Quantum Wells Grown on a- and c-Plane Sapphire Substrates

Yu Hong-Bo, Chen Hong, Li Dong-Sheng and Zhou Jun-Ming

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We investigate the structural and optical properties of InGaN-based multi-quantum wells grown on ac plane sapphire substrates by atomic force microscopy, high-resolution x-ray diffraction and temperature-dependent photoluminescence measurements. The multi-quantum wells grown on a-plane sapphire substrate show stronger exciton localization effect compared with that grown on the c-plane substrate, although the threading dislocation densities in the two samples are almost the same. We attribute the results to the different in-plane strain of quantum well grown on different substrate orientations at the same growth temperature. Since the exciton localization effect plays a key role to obtain high efficiency InGaN-based optoelectronics devices, the presented result should be emphasized.


PACS

68.65.Fg Quantum wells

78.55.Cr III-V semiconductors

78.67.De Quantum wells

68.37.Ps Atomic force microscopy (AFM)

73.21.Fg Quantum wells

Subjects

Condensed matter: electrical, magnetic and optical

Semiconductors

Surfaces, interfaces and thin films

Nanoscale science and low-D systems

Dates

Issue 7 (July 2004)

Received 15 March 2004



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