Jiang Song-Sheng et al 2001 Chinese Phys. Lett. 18 746 doi:10.1088/0256-307X/18/6/311
Jiang Song-Sheng, He Ming, Diao Li-Jun, Guo Jing-Ru and Wu Shao-Yong
Show affiliationsRemeasurement of the half-life of 79Se has been carried out with projectile x-ray detection (PXD) in accelerator mass spectrometry. We made two major improvements over our earlier 79Se half-life determination [Nucl. Instrum. Methods B 123 (1997) 403]. Firstly, the PXD technique has been used for separation of 79Se and 75Se from 79Br and 75As isobars respectively. Secondly, the half-life of 79Se has been measured relative to the known precise half-life of 75Se(119.79±0.04 d). A more reliable half-life of 79Se measured with the PXD technique is (2.95±0.38)×105 y, about a factor of one third lower than the previous value, 1.1 × 106 y. The problems in the previous measurement are discussed.
07.85.Fv X- and gamma-ray sources, mirrors, gratings, and detectors
27.50.+e 59(less-than-or-equal-to)A(less-than-or-equal-to)89
Issue 6 (June 2001)
Received 5 January 2001
Jiang Song-Sheng et al 2001 Chinese Phys. Lett. 18 746
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