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Scanning Tunnelling Microscope Tip-Induced Reconstruction on Si(111) (3)1/2×(3)1/2 R30°-Ag Surface

Li Bin1, Zeng Chang-Gan1, Wang Hai-Qian1,2, Wang Bing1 and Hou Jian-Guo1,2

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The reconstruction process of the Si(111) (3)1/2×(3)1/2 R30°-Ag surface is studied by using a scanning tunnelling microscope at 78 K. By applying a strong interaction between the tip and the surface, a tip-induced reconstruction corresponding to the mergence of two Si(111) (3)1/2×(3)1/2 R30°-Ag domains is observed. Based on the inequivalent trimers (IET) model, this reconstruction process is attributed to a transition between the clockwise and counterclockwise IET domains. With this transition, the honeycomb-chained-trimer Si(111) (3)1/2×(3)1/2 R30°-Ag anti-phase boundary disappears and changes to the IET structure.


PACS

68.35.B- Structure of clean surfaces (and surface reconstruction)

68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)

Subjects

Surfaces, interfaces and thin films

Dates

Issue 2 (February 2001)

Received 8 July 2000



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