Christian Girard 2005 Rep. Prog. Phys. 68 1883 doi:10.1088/0034-4885/68/8/R05
Christian Girard
Show affiliationsRecent progress in near-field optics instrumentation has led to a new class of subwavelength optical experiments in which near-field optical microscopes are used to image precisely the electromagnetic field distributions inside nanostructures microfabricated at the surface of dielectric wafers (microwaveguides, optical splitters, whispering-gallery modes, three-dimensional photonic crystals, metal nanoparticle gratings, plasmon waveguides, etc). In the light of these new advances, we review the physics of near-field optics in the presence of nanostructured materials (the so-called nano-optics). After the introductory part, revealing the main theoretical schemes and computation techniques well-suited for nano-optics, we will focus on several typical examples of calculations extracted from the recent literature. We will begin this series by revisiting the challenging problem of the optical addressing of both passive or active nanostructures in a subwavelength area. In this context, various procedures for the optimization of the energy transfer efficiency inside addressed nanostructures will be detailed. Finally, the concept of photonic local density of states in near-field optics will be revisited.
68.37.Uv Near-field scanning microscopy and spectroscopy
42.82.Cr Fabrication techniques; lithography, pattern transfer
Instrumentation and measurement
Surfaces, interfaces and thin films
Issue 8 (August 2005)
Received 13 April 2005, in final form 13 June 2005
Published 11 July 2005
Christian Girard 2005 Rep. Prog. Phys. 68 1883
Kevin Hyde et al 2005 Nanotechnology 16 S422
R Kim et al 1995 Phys. Med. Biol. 40 1475
Thomas Vojta 1997 J. Phys. A: Math. Gen. 30 L7
Paul R Barber et al 2001 Phys. Med. Biol. 46 63
Hyoung J Cho and Chong H Ahn 2003 J. Micromech. Microeng. 13 383
S I Lee et al 2004 Nanotechnology 15 416
D L Thompson et al 2005 J. Phys.: Conf. Ser. 16 252
Gih Keong Lau and Hejun Du 2006 J. Micromech. Microeng. 16 1833
S Ogihara et al 2009 J. Phys.: Conf. Ser. 191 012009