A V Crewe 1980 Rep. Prog. Phys. 43 621 doi:10.1088/0034-4885/43/5/002
A V Crewe
Show affiliationsThe high-resolution scanning transmission electron microscope has significantly different characteristics from the conventional electron microscope. The process of producing images is in itself quite different but most significantly it is a quantitative instrument which is capable of providing numerical data on the properties of thin specimens. The author discusses the physics involved in the design and operation of the instrument. He has made little attempt to give details in particular designs because such details already appear in the literature. Instead emphasis is placed on the capabilities and limitations of the instrument and give some ideas of the direction of future developments.
07.78.+s Electron, positron, and ion microscopes; electron diffractometers
Issue 5 (May 1980)
A V Crewe 1980 Rep. Prog. Phys. 43 621
H Marten and D Seeliger 1984 J. Phys. G: Nucl. Phys. 10 349
Adel F Antippa 2009 Eur. J. Phys. 30 605
M S Baig-Silva et al 2005 J. Neural Eng. 2 S29
J Baudon et al 1970 J. Phys. B: At. Mol. Phys. 3 207
A F Dufton 1931 J. Sci. Instrum. 8 159
H. Linke et al 1999 Europhys. Lett. 45 406
Jie Yang et al 2008 Supercond. Sci. Technol. 21 082001
C A Mayhew and J P Connerade 1986 J. Phys. B: At. Mol. Phys. 19 3505
Joachim Brand and William P Reinhardt 2001 J. Phys. B: At. Mol. Opt. Phys. 34 L113