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A new image correction method for live cell atomic force microscopy

Y Shen, J L Sun, A Zhang, J Hu and L X Xu

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During live cell imaging via atomic force microscopy (AFM), the interactions between the AFM probe and the membrane yield distorted cell images. In this work, an image correction method was developed based on the force–distance curve and the modified Hertzian model. The normal loading and lateral forces exerted on the cell membrane by the AFM tip were both accounted for during the scanning. Two assumptions were made in modelling based on the experimental measurements: (1) the lateral force on the endothelial cells was linear to the height; (2) the cell membrane Young's modulus could be derived from the displacement measurement of a normal force curve. Results have shown that the model could be used to recover up to 30% of the actual cell height depending on the loading force. The accuracy of the model was also investigated with respect to the loading force and mechanical property of the cell membrane.


PACS

87.64.Dz Scanning tunneling and atomic force microscopy

87.16.D- Membranes, bilayers, and vesicles

87.17.Aa Modeling, computer simulation of cell processes

87.19.R- Mechanical and electrical properties of tissues and organs

Subjects

Medical physics

Biological physics

Dates

Issue 8 (21 April 2007)

Received 1 December 2006, in final form 1 February 2007

Published 29 March 2007



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