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Refraction-angle resolution of diffraction enhanced imaging

Zhi-Feng Huang, Ke-Jun Kang and Zheng Li

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As a new method, x-ray diffraction enhanced imaging (DEI) has extremely high sensitivity for weakly absorbing low-Z samples in medical and biological fields. Conventional performance parameters, such as spatial resolution and low-contrast resolution, are not enough to describe the characteristics of a DEI system. This paper focuses on refraction-angle resolution which describes the ability of a DEI system to differentiate the x-rays refracted by the sample. The analysis of refraction-angle resolution is composed of two parts: the analysis of the single DEI image measured in a certain position of the rocking curve and the analysis of the refraction-angle image calculated by extraction methods. A 2D computer simulation experiment is performed to prove the results of the analyses. The limitations and conclusions of refraction-angle resolution are described in the end.


PACS

87.59.-e X-ray imaging

07.05.Tp Computer modeling and simulation

87.64.Bx Electron, neutron and x-ray diffraction and scattering

87.57.C- Image quality

Subjects

Instrumentation and measurement

Biological physics

Medical physics

Dates

Issue 12 (21 June 2006)

Received 7 March 2006

Published 31 May 2006



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