J W Durkee Jr et al 1998 Phys. Med. Biol. 43 2949 doi:10.1088/0031-9155/43/10/020
J W Durkee Jr, P P Antich, E N Tsyganov, A Constantinescu, J L Fernando, P V Kulkarni, B J Smith, G M Arbique, M A Lewis, T Nguyen, A Raheja, G Thambi and R W Parkey
Show affiliationsAn electronic collimation technique is developed which utilizes the chi-square goodness-of-fit measure to filter scattered gammas incident upon a medical imaging detector. In this data mining technique, Compton kinematic expressions are used as the chi-square fitting templates for measured energy-deposition data involving multiple-interaction scatter sequences. Fit optimization is conducted using the Davidon variable metric minimization algorithm to simultaneously determine the best-fit gamma scatter angles and their associated uncertainties, with the uncertainty associated with the first scatter angle corresponding to the angular resolution precision for the source. The methodology requires no knowledge of materials and geometry. This pattern recognition application enhances the ability to select those gammas that will provide the best resolution for input to reconstruction software. Illustrative computational results are presented for a conceptual truncated-ellipsoid polystyrene position-sensitive fibre head-detector Monte Carlo model using a triple Compton scatter gamma sequence assessment for a
Tc point source. A filtration rate of 94.3% is obtained, resulting in an estimated sensitivity approximately three orders of magnitude greater than a high-resolution mechanically collimated device. The technique improves the nominal single-scatter angular resolution by up to approximately 24 per cent as compared with the conventional analytic electronic collimation measure.
87.57.uh Single photon emission computed tomography (SPECT)
Issue 10 (October 1998)
Received 2 June 1997, in final form 12 May 1998
J W Durkee Jr et al 1998 Phys. Med. Biol. 43 2949
K Thornton and Mark Asta 2005 Modelling Simul. Mater. Sci. Eng. 13 R53
M C Fischer et al 2001 J. Opt. B: Quantum Semiclass. Opt. 3 279
S M Bidoki et al 2007 J. Micromech. Microeng. 17 967
T K Ko et al 2006 Semicond. Sci. Technol. 21 1064
Raghu N Kacker and James F Lawrence 2007 Metrologia 44 117
Keith Promislow and J Nathan Kutz 2000 Nonlinearity 13 675
Simon D M White 2007 Rep. Prog. Phys. 70 883
A. Belmonte and J.-M. Flesselles 1995 Europhys. Lett. 32 267
T M Uusitupa et al 2008 Phys. Med. Biol. 53 445