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Messung der Neigungsstreuung mikroskopischer Rauheiten in inkohärenten Lichtfeldern

H Cordes and M Grabe

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The shape of the scattering indicatrix of microscopic rough surfaces depends on material and geometrical properties of the surface as well as on optical conditions as wavelength and scattering geometry. We shall call the definite photometric observation of any part of the scattering indicatrix a gloss measurement. Roughness parameters calculated from incoherent gloss curves are compared with analogous data obtained with help of conventional tracing instruments.


PACS

07.60.Dq Photometers, radiometers, and colorimeters

68.35.Ct Interface structure and roughness

42.25.Fx Diffraction and scattering

Subjects

Instrumentation and measurement

Surfaces, interfaces and thin films

Optics, quantum optics and lasers

Dates

Issue 2 (April 1973)

Received 30 August 1972



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