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Comparison of the INRIM and PTB lattice-spacing standards

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E Massa1, G Mana1 and U Kuetgens2

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[1]

Synchrotron radiation-based x-ray reflection and scattering techniques for dimensional nanometrology

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[2]

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[3]

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[7]

Measurement of the lattice parameter of a silicon crystal

E Massa et al  New Journal of Physics 2009  11 053013
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