Quick search Find article
Quick search
Find article

Final report on the APMP comparison of capacitance at 10 pF: APMP.EM-K4.1

Leigh Johnson1, Wey Chua2, Andrew Corney3, Jimmy Hsu4, Hadi Sardjono5, Rae Duk Lee6, Zhang Zhonghua7, Ajchara Charoensook8, Peter Coogan1, Yasuhiro Nakamura9, Alan Moodley10, A K Saxena11, Y K Yan12, Abdul Rashid Bin Zainal Abidin13, Jinni Lee2 and Yuri Semenov14

Show affiliations


KEY COMPARISON

A comparison of capacitance at 10 pF was conducted between thirteen participating laboratories from the Asia-Pacific region. Measurements were made between 2004 and 2006. The behaviour of the travelling artefact was consistent with a steady linear drift at a rate of approximately 0.1 µF/F per year. Despite the wide range of capabilities within the region, the results showed good agreement between all but one of the participating laboratories.

Main text. To reach the main text of this paper, click on Final Report. Note that this text is that which appears in Appendix B of the BIPM key comparison database kcdb.bipm.org/.

The final report has been peer-reviewed and approved for publication by the CCEM, according to the provisions of the CIPM Mutual Recognition Arrangement (MRA).


Dates

Issue 1A ( 1 January 2009)



  1. Final report on the APMP comparison of capacitance at 10 pF: APMP.EM-K4.1

    Leigh Johnson et al 2009 Metrologia 46 01003

  2. Secrets of the metric in N = 4 and N = 2* geometries

    James Babington et al JHEP07(2001)034

  3. International key comparison of neutron fluence measurements in mono-energetic neutron fields: CCRI(III)-K10

    J Chen et al 2007 Metrologia 44 06005

  4. Electrical actuation of dielectric droplets

    N Kumari et al 2008 J. Micromech. Microeng. 18 085018

  5. APMP.QM-K3: automotive emission gas measurements

    Jin Seog Kim et al 2003 Metrologia 40 08009

  6. Diffusion and localization in carbon nanotubes and graphene nanoribbons

    Norbert Nemec et al 2008 New J. Phys. 10 065014

  7. A novel fabrication technique for free-hanging homogeneous polymeric cantilever waveguides

    Maria Nordström et al 2008 J. Micromech. Microeng. 18 015017

  8. Logical independence and quantum randomness

    T Paterek et al 2010 New J. Phys. 12 013019

  9. EUROMET.EM-S18 supplementary comparison of 1 Ω and 10 kΩ resistance standards

    P O Hetland et al 2005 Metrologia 42 01009

  10. High-cycle fatigue of micromachined single-crystal silicon measured using high-resolution patterned specimens

    T Ikehara and T Tsuchiya 2008 J. Micromech. Microeng. 18 075004

View by subject




Export





Please login to access our web services, or create an account if you don't yet have one.

You must have cookies enabled in your web browser to be able to login.

Username
Password

Forgotten your password? Get a new one here.