Yi-hua Tang and Barry Wood 2008 Metrologia 45 01005 doi:10.1088/0026-1394/45/1A/01005
Yi-hua Tang1 and Barry Wood2
Show affiliationsA comparison between the National Institute of Standards and Technology (NIST) and the National Research Council (NRC) Josephson voltage standards (JVS) was carried out at the NRC from 13 August to 17 August 2007. The comparison was made at the 10 V level. It was a two-way direct JVS comparison, which means that the NIST JVS provided a voltage at 10 V and was measured against the NRC JVS with NRC's measuring system (hardware and software). The comparison was repeated by using the NIST JVS measuring system to measure a voltage at 10 V provided by the NRC JVS. The results from the two comparisons were consistent. The difference between the NIST CJVS and the NRC JVS is −0.28 nV with an expanded uncertainty (k = 2) of 2.07 nV at 10 V or 2.07 parts in 1010.
Main text. To reach the main text of this paper, click on Final Report. Note that this text is that which appears in Appendix B of the BIPM key comparison database kcdb.bipm.org/.
The final report has been peer-reviewed and approved for publication by the CCEM, according to the provisions of the CIPM Mutual Recognition Arrangement (MRA).
Issue 1A ( 1 January 2008)
Yi-hua Tang and Barry Wood 2008 Metrologia 45 01005
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