Quick search Find article
Quick search
Find article

Uncertainties on distance and chromatic dispersion measurement using optical low-coherence reflectometry

A-F Obaton, A Quoix and J Dubard

Show affiliations


The optical low-coherence reflectometer (OLCR) is a very powerful tool to characterize optical fibres and integrated optical components. However, this is a very complex set-up and in addition to that it performs Fourier transforms. Evaluating uncertainty in these conditions becomes very complicated. To overcome this difficulty, we chose to use an alternative statistical method as partly described in the ISO5725 standard. The most significant quantities which can be extracted from the OLCR measurements are length and chromatic dispersion (CD) of the optical component. An uncertainty of 0.036 mm (k = 2) for the length and of 0.12 ps nm−1 km−1 (k = 2) for the CD can be achieved for a 1 m long G652 type fibre.


PACS

42.81.Dp Propagation, scattering, and losses; solitons

07.60.Hv Refractometers and reflectometers

42.30.Kq Fourier optics

42.25.Kb Coherence

Subjects

Instrumentation and measurement

Optics, quantum optics and lasers

Dates

Issue 1 (February 2008)

Received 5 October 2007

Published 18 January 2008



  1. Uncertainties on distance and chromatic dispersion measurement using optical low-coherence reflectometry

    A-F Obaton et al 2008 Metrologia 45 83

  2. Uncertainty budget for the NIST electron counting capacitance standard, ECCS-1

    Mark W Keller et al 2007 Metrologia 44 505

  3. Crystal field of Dy implanted in Al single crystals, obtained by Mossbauer spectroscopy

    P J Kikkert and L Niesen 1981 J. Phys. F: Met. Phys. 11 1597

  4. Tikhonov regularization for electrical impedance tomography on unbounded domains

    Michael Lukaschewitsch et al 2003 Inverse Problems 19 585

  5. A cold atmospheric pressure plasma jet controlled with spatially separated dual-frequency excitations

    Z Cao et al 2009 J. Phys. D: Appl. Phys. 42 222003

  6. Optical frequency/wavelength references

    L Hollberg et al 2005 J. Phys. B: At. Mol. Opt. Phys. 38 S469

  7. A magnetic environment model of moment defects in antiferromagnetic γ-MnNi alloys

    O Moze and T J Hicks 1984 J. Phys. F: Met. Phys. 14 221

  8. Novel exposure methods based on reflection and refraction effects in the field of SU-8 lithography

    Won-Jong Kang et al 2006 J. Micromech. Microeng. 16 821

  9. Metal-insulator transition in epitaxial thin films of BaRuO3

    Davinder Kaur and K V Rao 2003 J. Phys. D: Appl. Phys. 36 156

  10. Electrostatic field-assisted alignment of electrospun nanofibres

    A Theron et al 2001 Nanotechnology 12 384

View by subject




Export






Please login to access our web services, or create an account if you don't yet have one.

You must have cookies enabled in your web browser to be able to login.

Username
Password

Forgotten your password? Get a new one here.