Meelis Sildoja et al 2008 Metrologia 45 11 doi:10.1088/0026-1394/45/1/002
Meelis Sildoja, Farshid Manoocheri and Erkki Ikonen
Show affiliationsMethods for reducing reflectance losses at multiple wavelengths with a silicon photodiode detector are described. Using thick oxide layer and Brewster-angle operation it is shown that specular reflectance losses can be theoretically decreased below 1 ppm (part per million) in a simple measurement arrangement. Additionally, a detector structure is presented which can be used to reduce the measurement uncertainties due to diffuse reflectance below 1 ppm, even if the total diffuse reflectance losses from a plain photodiode would be two orders of magnitude larger.
85.60.Dw Photodiodes; phototransistors; photoresistors
06.20.fb Standards and calibration
42.25.Gy Edge and boundary effects; reflection and refraction
Issue 1 (February 2008)
Received 5 September 2007
Published 18 December 2007
Meelis Sildoja et al 2008 Metrologia 45 11
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