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Reducing photodiode reflectance by Brewster-angle operation

Meelis Sildoja, Farshid Manoocheri and Erkki Ikonen

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Methods for reducing reflectance losses at multiple wavelengths with a silicon photodiode detector are described. Using thick oxide layer and Brewster-angle operation it is shown that specular reflectance losses can be theoretically decreased below 1 ppm (part per million) in a simple measurement arrangement. Additionally, a detector structure is presented which can be used to reduce the measurement uncertainties due to diffuse reflectance below 1 ppm, even if the total diffuse reflectance losses from a plain photodiode would be two orders of magnitude larger.


PACS

85.60.Dw Photodiodes; phototransistors; photoresistors

06.20.fb Standards and calibration

42.25.Gy Edge and boundary effects; reflection and refraction

Subjects

Electronics and devices

Instrumentation and measurement

Optics, quantum optics and lasers

Dates

Issue 1 (February 2008)

Received 5 September 2007

Published 18 December 2007



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