Dionisio Hernández 1, Enrique Navarrete 1, David Avilés 1 and Yi-hua Tang 2
1
Centro Nacional de Metrología (CENAM), Km 4,5 carretera a los Cues, el Marqués, Querétaro, México
2
National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, USA
Dionisio Hernández et al 2007 Metrologia 44 01011
A comparison of Josephson voltage standards (JVS) between the National Institute of Standards and Technology (NIST) and the Centro Nacional de Metrología (CENAM) held at CENAM from 21 to 23 March 2006 is reported. The comparison was made at the 10 V level by measuring four Zener references using the JVS of CENAM and the transportable Compact Josephson Voltage Standard (CJVS) of NIST. The difference between the measurements was –34.7 nV with an uncertainty of 43.2 nV at 95% level of confidence.
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Issue 1A ( 1 January 2007)
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