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AC longitudinal and contact resistance measurements of quantum Hall devices

J Schurr1, F-J Ahlers1, G Hein1, J Melcher1, K Pierz1, F Overney2 and B M Wood3

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A new coaxial measurement system has been developed to investigate the ac longitudinal resistance along the high-potential side of the quantum Hall resistance (QHR). A novel equivalent circuit of the QHR is used to analyse the ac measurements of the longitudinal resistances along both the low- and high-potential sides of the QHR sample. In addition, a bridge for the measurement of ac contact resistances of the sample is presented. For the first time, it is now possible to perform all the ac measurements whose dc equivalents are well established for reliable dc quantum Hall measurements. While the ac longitudinal resistances on the high- and low-potential sides of the sample are very similar, interesting differences have been observed at high resolution.


PACS

73.40.Cg Contact resistance, contact potential

73.43.-f Quantum Hall effects

85.30.Fg Bulk semiconductor and conductivity oscillation devices (including Hall effect devices, space-charge-limited devices, and Gunn effect devices)

Subjects

Electronics and devices

Semiconductors

Surfaces, interfaces and thin films

Dates

Issue 1 (February 2006)

Received 15 September 2005

Published 27 January 2006



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