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Development and absolute frequency measurement of a pair of 778 nm two-photon rubidium standards

C S Edwards1,2, G P Barwood1, H S Margolis1, P Gill1,2 and W R C Rowley1

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A pair of diode laser frequency standards stabilized to 778 nm two-photon rubidium transitions have been developed and characterized. Their sensitivity to vapour pressure, modulation depth and optical power have been investigated, along with their relative stability and day-to-day reproducibility. The Allan deviation of the standards locked to the 5 2S1/2(Fg = 3)–5 2D5/2(Fe = 5) transition of 85Rb is 9.3 × 10−13τ−1/2 for 1 s < τ < 100 s, reaching a floor of 1 × 10−13 at 100 s. The long-term repeatability of an individual system locked to this line is 1.2 kHz, corresponding to 3.1 parts in 1012. The system-to-system reproducibility is limited by cell impurities to 4.9 kHz and 4.5 kHz, respectively, for this line and the 5 2S1/2(Fg = 2)–5 2D5/2(Fe = 4) transition in 87Rb. The mean observed frequencies for these transitions, averaged for the two systems and corrected for light shift and second-order relativistic Doppler effect, are 385 285 142 375.1 (4.9) kHz and 385 284 566 374.2 (4.5) kHz, respectively.


PACS

42.60.Lh Efficiency, stability, gain, and other operational parameters

42.60.Jf Beam characteristics: profile, intensity, and power; spatial pattern formation

42.60.By Design of specific laser systems

42.55.Px Semiconductor lasers; laser diodes

Subjects

Optics, quantum optics and lasers

Dates

Issue 5 (October 2005)

Received 19 May 2005

Published 6 October 2005



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