A Picard and H Fang 2004 Metrologia 41 333 doi:10.1088/0026-1394/41/4/016
A Picard and H Fang
Show affiliationsThe purpose of this work is to study the effect of water vapour sorption on mass standards by means of two methods: (a) a global and direct gravimetric method determining the water vapour deposit on the total surface area of mass standards; (b) an optical and indirect ellipsometric method permitting the evaluation of the adsorbed water thickness on the localized surface of mass standards.
The coefficient of water vapour adsorption in moist air and the amount of water desorption from air to vacuum were determined on the surfaces of mass standards. Measurements were achieved by both methods using the same samples of Pt/Ir, stainless steel and silicon. Results obtained on stainless steel showed a good agreement between the two methods. For the Pt/Ir and the silicon samples, the sorption effect evaluated by the gravimetric method was about twice that inferred from ellipsometry.
Issue 4 (August 2004)
Received 18 February 2004
Published 30 June 2004
A Picard and H Fang 2004 Metrologia 41 333
J M Aguirregabiria et al 2004 Eur. J. Phys. 25 555
J Mitroy et al 1999 J. Phys. B: At. Mol. Opt. Phys. 32 2203
M S M Saifullah et al 2002 Nanotechnology 13 659
T Dereli and R W Tucker 2004 Class. Quantum Grav. 21 1459
Sandro Wimberger et al 2003 Nonlinearity 16 1381
Tom Timusk and Bryan Statt 1999 Rep. Prog. Phys. 62 61
B M Wood and S Solve 2009 Metrologia 46 R13
V A Zaznoba et al 1979 Plasma Phys. 21 557
Muraari Vasudevan et al 2005 Class. Quantum Grav. 22 339