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Measurement repetitions of the Si(220) lattice spacing

G Cavagnero1, H Fujimoto2, G Mana1,4, E Massa1, K Nakayama2 and G Zosi3

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This paper presents the results of measurements carried out at the Istituto di Metrologia 'G Colonnetti' (IMGC) and the National Metrology Institute of Japan (NMIJ) in order to investigate the disagreement between the respective past determinations of the (220) lattice spacing of Si. A bug in the past IMGC experiment has been identified and eliminated. The discrepancy having been removed, improved lattice spacing values are given. Basically, these values confirm the NMIJ determination but not the IMGC one.


PACS

07.60.Ly Interferometers

06.20.Dk Measurement and error theory

07.85.-m X- and γ-ray instruments

Subjects

Instrumentation and measurement

Dates

Issue 1 (February 2004)

Received 30 October 2003

Published 16 December 2003


An Erratum for this article has been published in 2004 Metrologia 41 445


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