This site uses cookies. By continuing to use this site you agree to our use of cookies. To find out more, see our
Privacy and Cookies policy.
P M Kennedy and Z H Stachurski 1986 J. Phys. E: Sci. Instrum. 19 115 doi:10.1088/0022-3735/19/2/003
P M Kennedy and Z H Stachurski
Show affiliationsA new type of extensometer is described in which light sensors and a light source, together with a dedicated microcomputer provide a simple semi-contact method of strain measurement which can be applied to complex-shaped non-planar specimens. By scanning light past two small light-sensitive diodes affixed to a specimen, a microcomputer-controlled timing system can yield reliable extension measurements. At the present stage of development an extension of 0.025 mm or a strain of 0.04% or better may be measured.
85.40.Bh Computer-aided design of microcircuits; layout and modeling
Issue 2 (February 1986)
P M Kennedy and Z H Stachurski 1986 J. Phys. E: Sci. Instrum. 19 115
T Brenner et al 1988 J. Phys. E: Sci. Instrum. 21 1150
F O Otieno et al 1997 Meas. Sci. Technol. 8 239
