H J Goldsmid and J N Johnston 1981 J. Phys. E: Sci. Instrum. 14 1329 doi:10.1088/0022-3735/14/11/026
H J Goldsmid and J N Johnston
Show affiliationsWhen a hard probe of relatively low thermal conductivity is pressed against a number of softer materials of much higher conductivity, the thermal contact resistance should depend only on the radius of contact. Thus, the authors have applied a device, that consists of a heated copper-constantan thermocouple with a ruby tip, to several high conductivity metals and alloys and may have shown that the resultant thermoelectric EMF is directly related to the diagonal length of the indentation produced by a conventional pyramid hardness tester under a given load. They have also found that the probe can be used in studying the hardness of a material that is a poorer conductor of heat but it is then necessary to apply a correction factor.
72.15.Eb Electrical and thermal conduction in crystalline metals and alloys
81.70.Bt Mechanical testing, impact tests, static and dynamic loads
62.20.Qp Friction, tribology, and hardness
81.40.Np Fatigue, corrosion fatigue, embrittlement, cracking, fracture, and failure
Issue 11 (November 1981)
H J Goldsmid and J N Johnston 1981 J. Phys. E: Sci. Instrum. 14 1329
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E Cecchetto et al 2005 J. Phys.: Condens. Matter 17 2825
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R Klages and N Korabel 2002 J. Phys. A: Math. Gen. 35 4823