T Pisarkiewicz 1979 J. Phys. E: Sci. Instrum. 12 225 doi:10.1088/0022-3735/12/3/019
T Pisarkiewicz
Show affiliationsA method and an apparatus for measuring the dispersion characteristics of thin-film metal-insulator-metal structures at frequencies below 1 Hz are described. Application of this apparatus makes it possible to study the complex permittivity of thin films having a loss tangent of the order of 10.
77.22.Ch Permittivity (dielectric function)
Issue 3 (March 1979)
T Pisarkiewicz 1979 J. Phys. E: Sci. Instrum. 12 225
M B Ewing et al 1986 Metrologia 22 93
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