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Study of photoconductive PbTe films by the method of variance analysis of X-ray diffraction profiles

N L P Sinha, B K Samantary, A K Chaudhuri and H N Bose

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Effective crystalline size and strain in 'as-grown' and annealed photoconductive PbTe films of various thicknesses ( approximately 2000 AA and greater) have been determined by the method of variance analysis of the X-ray diffraction line profiles. Photosensitivity measurements have been made on the same films and it has been observed that there is a decrease in photosensitivity and microstrain with increase in crystallite size. The crystallite size increases and microstrain decreases when the films are heat-treated at 200 degrees C but the photosensitivity is markedly increased. The effect is probably due to chemisorbed oxygen.


PACS

72.40.+w Photoconduction and photovoltaic effects

73.50.Pz Photoconduction and photovoltaic effects

68.43.-h Chemisorption/physisorption: adsorbates on surfaces

Subjects

Condensed matter: electrical, magnetic and optical

Surfaces, interfaces and thin films

Dates

Issue 5 (1 April 1976)



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