R Atkinson and G A Jones 1976 J. Phys. D: Appl. Phys. 9 L131 doi:10.1088/0022-3727/9/11/004
R Atkinson and G A Jones
Show affiliationsThe scanning electron microscope (SEM) has been successfully used to detect (type I) magnetic contrast in thin films of MnBi. The domain structures observed consisted of an irregular patchwork, typical of these films in the as-deposited condition, with a domain width in the region of 3 mu m. Efforts to resolve the maze domain configuration (spacing approximately 0.3 mu m) with the SEM were however not successful.
75.70.Kw Domain structure (including magnetic bubbles)
68.37.Hk Scanning electron microscopy (SEM) (including EBIC)
Issue 11 (1 August 1976)
R Atkinson and G A Jones 1976 J. Phys. D: Appl. Phys. 9 L131
Li Zhi and Han Chong-Zhao 2002 Chinese Phys. 11 666
Y Yamada et al 2006 Metrologia 43 L23
G Beutier et al 2009 New J. Phys. 11 113026
Helena Maier-Metz 1998 Eur. J. Phys. 19 137
O Giraud 2004 J. Phys. A: Math. Gen. 37 2751
Jessie L. Christiansen et al. 2010 ApJ 710 97
Gennady Shvets and Yaroslav A Urzhumov 2006 J. Opt. A: Pure Appl. Opt. 8 S122
2001 Phys. Educ. 36 508
Y F Yuan et al 2005 Nanotechnology 16 803