Direct lattice imaging of silicon carbide

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Published under licence by IOP Publishing Ltd
, , Citation P L Gai et al 1975 J. Phys. D: Appl. Phys. 8 L157 DOI 10.1088/0022-3727/8/13/002

0022-3727/8/13/L157

Abstract

The high-resolution electron microscopic technique of lattice imaging shows 15 and 3 AA repeat sequences in 6H SiC. The 15 AA sequence is further resolved into 2.5 AA layers corresponding to the interlayer separation.

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10.1088/0022-3727/8/13/002