G F Cerofolini et al 2009 J. Phys. D: Appl. Phys. 42 225301 doi:10.1088/0022-3727/42/22/225301
G F Cerofolini1,3, E Romano1, G Giorgi2 and P Belanzoni2
Show affiliationsNet-charge analysis, involving siladamantane moieties as local models of various surface silicon atoms, is used in combination with infrared spectroscopy to assign chemical species to the features observed in the x-ray photoelectron spectra from hydrogen-terminated (1 0 0) Si prepared by HFaq etching of the native oxide.
79.60.Bm Clean metal, semiconductor, and insulator surfaces
81.65.Cf Surface cleaning, etching, patterning
78.30.Am Elemental semiconductors and insulators
78.68.+m Optical properties of surfaces
82.80.Pv Electron spectroscopy (x-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
Condensed matter: electrical, magnetic and optical
Issue 22 (21 November 2009)
Received 11 May 2009, in final form 17 September 2009
Published 26 October 2009
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