Jianzheng Hu et al 2008 J. Phys. D: Appl. Phys. 41 035107 doi:10.1088/0022-3727/41/3/035107
Jianzheng Hu, Lianqiao Yang and Moo Whan Shin
Show affiliationsThe degradation of high power GaN/InGaN blue light-emitting diodes (LEDs) was investigated by considering the electrical, optical and thermal ageing characteristics. The LED samples were stressed at the elevated temperature of 85 °C with an injection current of 350 mA. Changes in the tunnelling current and series resistance for the electrical characteristics and an initial increase followed by a gradual decrease for the optical power were observed. Variations of the thermal resistance in the chip and package were found to be 2 °C W−1 and 0.3 °C W−1, respectively. The responsible factors were proposed to be: (a) the dopant activation and changes of defects in the chip level; (b) the yellowing of the optical lens and structural degradations such as generating voids or delaminations in the package level. The changes in the electrical, optical and thermal characteristics were found to depend on and affect each other. The internal relationship for the characteristics of the three aspects was explained.
85.60.Jb Light-emitting devices
85.60.Bt Optoelectronic device characterization, design, and modeling
73.40.Kp III-V semiconductor-to-semiconductor contacts, p-n junctions, and heterojunctions
Issue 3 (7 February 2008)
Received 8 October 2007, in final form 27 November 2007
Published 11 January 2008
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