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Pinhole formation in capacitively coupled external electrode fluorescent lamps

Guangsup Cho1, Jooyoung Lee1, Deaheung Lee1, Jehuan Koo1, Eunha Choi1, Bongsoo Kim2, Sanghun Lee2, Minsoon Pak2, Junegill Kang2 and John P Verboncoeur3

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Application of power higher than the optimum operation value to an external electrode fluorescent lamp (EEFL) leads to the formation of pinholes, which subsequently leads to lamp failure. Small holes, called pinholes, are formed through the external electrode and the glass tube when a high voltage with a high power is applied. The phenomenon of pinhole formation has been investigated, including the conditions under which they occur and the characteristics such as size and location on the electrode. Pinhole formation has been analysed and shown to be the insulation layer breakdown of glass in the dielectric barrier discharge of capacitively coupled EEFLs.


PACS

42.72.Bj Visible and ultraviolet sources

84.47.+w Vacuum tubes

84.70.+p High-current and high-voltage technology: power systems; power transmission lines and cables

77.22.Jp Dielectric breakdown and space-charge effects

Subjects

Condensed matter: electrical, magnetic and optical

Electronics and devices

Optics, quantum optics and lasers

Dates

Issue 20 (21 October 2004)

Received 7 May 2004, in final form 2 September 2004

Published 29 September 2004



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