Guangsup Cho et al 2004 J. Phys. D: Appl. Phys. 37 2863 doi:10.1088/0022-3727/37/20/012
Guangsup Cho1, Jooyoung Lee1, Deaheung Lee1, Jehuan Koo1, Eunha Choi1, Bongsoo Kim2, Sanghun Lee2, Minsoon Pak2, Junegill Kang2 and John P Verboncoeur3
Show affiliationsApplication of power higher than the optimum operation value to an external electrode fluorescent lamp (EEFL) leads to the formation of pinholes, which subsequently leads to lamp failure. Small holes, called pinholes, are formed through the external electrode and the glass tube when a high voltage with a high power is applied. The phenomenon of pinhole formation has been investigated, including the conditions under which they occur and the characteristics such as size and location on the electrode. Pinhole formation has been analysed and shown to be the insulation layer breakdown of glass in the dielectric barrier discharge of capacitively coupled EEFLs.
Issue 20 (21 October 2004)
Received 7 May 2004, in final form 2 September 2004
Published 29 September 2004
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