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Imaging Amperian currents by Lorentz microscopy

S McVitie1 and G S White2

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The magnetic structure of thin films may be imaged in a transmission electron microscope by the techniques of Lorentz microscopy. In this paper, we re-interpret the underlying principles behind this imaging mode to show that it may be considered, in appropriate circumstances, as Amperian current microscopy. One of the benefits of this interpretation is that results from micromagnetic simulations may now be more easily formulated into the corresponding images expected from Lorentz microscopy. Examples are given in this paper which demonstrate the utility of this approach and also provide excellent agreement by direct comparison between experimental and simulated images of magnetic thin film structures.


PACS

75.70.Ak Magnetic properties of monolayers and thin films

68.37.Lp Transmission electron microscopy (TEM)

68.55.-a Thin film structure and morphology

Subjects

Surfaces, interfaces and thin films

Dates

Issue 2 (21 January 2004)

Received 15 July 2003

Published 19 December 2003



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