Application of excitation cross sections to optical plasma diagnostics

Author

John B Boffard 1, Chun C Lin 1 and Charles A DeJoseph Jr 2

Affiliations

1 Department of Physics, University of Wisconsin, 1150 University Ave., Madison WI, 53706, USA
2 Air Force Research Laboratory, Wright-Patterson AFB, OH, USA

Journal

Journal of Physics D: Applied Physics Create an alert RSS this journal

Issue

Volume 37, Number 12

Citation

John B Boffard et al 2004 J. Phys. D: Appl. Phys. 37 R143

doi: 10.1088/0022-3727/37/12/R01


TOPICAL REVIEW

 
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Abstract

Many optical-based plasma diagnostic techniques require electron-impact excitation cross sections. In recent years, a considerable number of new results have become available for excitation of rare-gas atoms from both the ground state and metastable states. Using relatively simple techniques these cross sections can be combined with plasma emission measurements to extract many useful plasma parameters such as the electron temperature. Many of the limitations of simple plasma emission models such as the corona model can be overcome by using cross section measurements to select what particular emission lines to use in the analysis.

 
PACS

52.70.Kz Optical (ultraviolet, visible, infrared) measurements

34.80.Dp Atomic excitation and ionization

52.25.Tx Emission, absorption, and scattering of particles

52.25.Kn Thermodynamics of plasmas

Subjects

Atomic and molecular physics

Instrumentation and measurement

Plasma physics

Dates

Issue 12 (21 June 2004)

Received 8 March 2004

Published 26 May 2004



  1. Application of excitation cross sections to optical plasma diagnostics

    John B Boffard et al 2004 J. Phys. D: Appl. Phys. 37 R143

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