John B Boffard et al 2004 J. Phys. D: Appl. Phys. 37 R143 doi:10.1088/0022-3727/37/12/R01
Application of excitation cross sections to optical plasma diagnostics
REVIEW ARTICLEJohn B Boffard1, Chun C Lin1 and Charles A DeJoseph Jr2
Show affiliationsTOPICAL REVIEW
Many optical-based plasma diagnostic techniques require electron-impact excitation cross sections. In recent years, a considerable number of new results have become available for excitation of rare-gas atoms from both the ground state and metastable states. Using relatively simple techniques these cross sections can be combined with plasma emission measurements to extract many useful plasma parameters such as the electron temperature. Many of the limitations of simple plasma emission models such as the corona model can be overcome by using cross section measurements to select what particular emission lines to use in the analysis.
- PACS
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52.70.Kz Optical (ultraviolet, visible, infrared) measurements
34.80.Dp Atomic excitation and ionization
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- Dates
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Issue 12 (21 June 2004)
Received 8 March 2004
Published 26 May 2004
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Application of excitation cross sections to optical plasma diagnostics
John B Boffard et al 2004 J. Phys. D: Appl. Phys. 37 R143
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