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Zinc oxide—a transparent, conducting IR-reflector prepared by rf-magnetron sputtering

Rajesh Das and Swati Ray

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Al doped zinc oxide thin films with different electrical and optical properties have been developed by both non-reactive and reactive rf-magnetron sputtering in Ar and Ar+H2 atmospheres, respectively. The thin films prepared under Ar+H2 gas ambient at substrate temperatures of 100°C and 300°C show high conductivity and improved IR-reflectivity. The lowest resistivity obtained is 4.5×10−4 Ω cm at 300°C. The transmission of the ZnO : Al film in the visible range is above 90% and that at 1400 nm is only 3.2%. Most of the IR-region is thus reflected. The carrier concentration of this transparent, conducting ZnO film prepared under Ar+H2 atmosphere is 2.3×1021 cm−3. Tranmission electron micrographs reveal that the average crystallite of the sample deposited under Ar+H2 ambient is smaller compared to those prepared under Ar ambient. The langle100rangle, langle002rangle orientations of ZnO with wurtzite structure are observed from transmission electron diffraction pattern.


PACS

73.61.Ga II-VI semiconductors

68.37.Lp Transmission electron microscopy (TEM)

61.05.J- Electron diffraction and scattering

78.66.Hf II-VI semiconductors

81.15.Cd Deposition by sputtering

Subjects

Semiconductors

Surfaces, interfaces and thin films

Dates

Issue 2 (21 January 2003)

Received 23 July 2002

Published 30 December 2002



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