N Koteswara Reddy et al 1999 J. Phys. D: Appl. Phys. 32 988 doi:10.1088/0022-3727/32/9/307
N Koteswara Reddy
, K T Ramakrishna Reddy
, G Fisher
, R Best
and P K Dutta![]()
Thin layers of tin monosulphide have been grown from equimolar solutions of tin chloride and N,N-dimethyl thiourea on Corning 7059 glass substrates at various temperatures in the range 100-450 °C using spray pyrolysis. The structural properties have been determined by using x-ray diffraction and scanning electron microscopy to evaluate the crystalline phases present and the surface topography of the grown layers. The changes observed in the structural phases with the growth temperature during the film formation are reported and discussed.
68.55.-a Thin film structure and morphology
68.55.A- Nucleation and growth
68.37.Hk Scanning electron microscopy (SEM) (including EBIC)
Issue 9 (7 May 1999)
Received 2 February 1998
N Koteswara Reddy et al 1999 J. Phys. D: Appl. Phys. 32 988
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