J de Urquijo et al 1999 J. Phys. D: Appl. Phys. 32 41 doi:10.1088/0022-3727/32/1/008
J de Urquijo, C A Arriaga, C Cisneros and I Alvarez
Show affiliationsA pulsed Townsend swarm technique has been used to study electron-ionization and electron-attachment processes in methane over the density-normalized electrical field strength,
, in the range 1.2-30 fV
(120-3000 Td). The time-resolved ionic avalanches were obtained under conditions such that the occurrence of electron-attachment processes was detected unambiguously. The analysis of these avalanche pulses resulted in values of the effective ionization coefficients and positive-ion mobilities over the above
range. To the best of our knowledge, no values of positive-ion mobilities had been published before for
Td. The electron-attachment effects were observed up to
Td.
51.10.+y Kinetic and transport theory of gases
34.80.Lx Recombination, attachment, and positronium formation
51.50.+v Electrical properties (ionization, breakdown, electron and ion mobility, etc.)
Issue 1 (7 January 1999)
Received 4 June 1998, in final form 21 September 1998
J de Urquijo et al 1999 J. Phys. D: Appl. Phys. 32 41
Hirotake Sugawara and Y Sakai 1999 J. Phys. D: Appl. Phys. 32 1671
Hirotake Sugawara et al 1998 J. Phys. D: Appl. Phys. 31 319
O Ambacher 1998 J. Phys. D: Appl. Phys. 31 2653
L C Ingesson and V V Pickalov 1996 J. Phys. D: Appl. Phys. 29 3009
H Tagashira et al 1977 J. Phys. D: Appl. Phys. 10 1051
N A Greaves 1976 J. Phys. C: Solid State Phys. 9 L181
P Mansfield and P K Grannell 1973 J. Phys. C: Solid State Phys. 6 L422
R Haydock et al 1972 J. Phys. C: Solid State Phys. 5 2845
M Jaros 1972 J. Phys. C: Solid State Phys. 5 1985