C Michaelsen et al 1997 J. Phys. D: Appl. Phys. 30 3167 doi:10.1088/0022-3727/30/23/001
Investigating the thermodynamics and kinetics of thin film reactions by differential scanning calorimetry
REVIEW ARTICLEC Michaelsen
, K Barmak
and T P Weihs§
REVIEW ARTICLE
In this paper we demonstrate the utility of differential scanning calorimetry for investigating the thermodynamics and kinetics of a broad range of thin film reactions. We begin by describing differential scanning calorimeters and the preparation of thin film samples. We then cite a number of examples that illustrate how enthalpies of crystallization, heats of formation and enthalpies of interfaces can be measured using layered thin films of Ni/Al, Cu/Zr and Zr/Al and homogeneous thin films of Co - Si, Nb - Cu, Cr - Cu and Ge - Sn. Following these examples of thermodynamic measurements, we show how kinetic parameters of nucleation, growth and coarsening can also be determined from differential scanning calorimetry traces using layered thin films of Ni/Al, Ti/Al and Nb/Al and homogenous thin films of Co - Si and Ge - Sn. The thermodynamic and kinetic investigations highlighted in these examples demonstrate that one can characterize phase transformations that are relevant to commercial applications and scientific studies both of thin films and of bulk materials.
- PACS
-
82.60.Fa Heat capacities and heats of phase transitions
81.15.Jj Ion and electron beam-assisted deposition; ion plating
82.60.Cx Enthalpies of combustion, reaction, and formation
64.70.D- Solid–liquid transitions
82.60.Nh Thermodynamics of nucleation
81.15.Cd Deposition by sputtering
- Subjects
-
Soft matter, liquids and polymers
Surfaces, interfaces and thin films
- Dates
-
Issue 23 (7 December 1997)
Received 15 July 1997
-
Investigating the thermodynamics and kinetics of thin film reactions by differential scanning calorimetry
C Michaelsen et al 1997 J. Phys. D: Appl. Phys. 30 3167
-
Periodic wave solutions of the Boussinesq equation
Yi Zhang et al 2007 J. Phys. A: Math. Theor. 40 5539
-
Modulated charged defects and conduction behaviour in doped BiFeO3 thin films
Y Wang and J Wang 2009 J. Phys. D: Appl. Phys. 42 162001
-
Casimir effect for the scalar field under Robin boundary conditions: a functional integral approach
Luiz C de Albuquerque and R M Cavalcanti 2004 J. Phys. A: Math. Gen. 37 7039
-
Novel XAFS capabilities at ELETTRA synchrotron light source
Andrea Di Cicco et al 2009 J. Phys.: Conf. Ser. 190 012043
-
Complex TCNQ salts with asymmetric donors. I. Transport properties
K Holczer et al 1978 J. Phys. C: Solid State Phys. 11 4707
-
An elementary derivation of Lloyd's formula valid for full-potential multiple-scattering theory
Rudolf Zeller 2004 J. Phys.: Condens. Matter 16 6453
-
List of Participants
2007 Class. Quantum Grav. 24
-
Timelike surfaces in Lorentz covariant loop gravity and spin foam models
Sergei Alexandrov and Zoltán Kádár 2005 Class. Quantum Grav. 22 3491
-
Label-free continuous cell sorter with specifically adhesive oblique micro-grooves
Takahiro Nishimura et al 2009 J. Micromech. Microeng. 19 125002
Users also read
What's this?- Realizing the geothermal electricity potential—water use and consequences
- In vivo deployment of mechanically adaptive nanocomposites for intracortical microelectrodes
- Pixel detectors for x-ray imaging spectroscopy in space