F Shoji et al 1989 J. Phys. D: Appl. Phys. 22 169 doi:10.1088/0022-3727/22/1/024
F Shoji, M Watamori, T Kuroi, K Oura and T Hanawa
Show affiliationsA combined technique of low-energy Na+ ion scattering spectroscopy (Na+ ISS) and low-energy electron diffraction is applied to study the initial growth process of Ag films on Si(111) surfaces. In comparison with results obtained by Auger electron spectroscopy, the Na+ ISS is also found to reflect reasonably well the Stranski-Krastanov growth mode or the Frank van der Merwe growth mode. Moreover, owing to the extreme sensitivity of the outermost surface layer, the Na+ ISS gives information on changes in the surface morphology induced by the Ag adsorption and subsequent annealing.
79.20.Fv Electron impact: Auger emission
68.49.Sf Ion scattering from surfaces (charge transfer, sputtering, SIMS)
68.55.A- Nucleation and growth
78.66.Bz Metals and metallic alloys
68.47.Fg Semiconductor surfaces
79.20.Rf Atomic, molecular, and ion beam impact and interactions with surfaces
Condensed matter: electrical, magnetic and optical
Issue 1 (14 January 1989)
F Shoji et al 1989 J. Phys. D: Appl. Phys. 22 169
S A Hilbert et al 2009 J. Phys. B: At. Mol. Opt. Phys. 42 141001
S Palucha et al 2002 J. Phys.: Condens. Matter 14 1223
J P Keating and A I Neishtadt 2008 Nonlinearity 21
T J Nightingale and J Crawford 1991 Metrologia 28 233
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